Riffyn’s unique flexibility enables us to capture processes as they evolve, which means that we can now capture and integrate all data, from R&D to production, with one adaptive digital system.
— Principal Scientist, Epibiome

Unparalleled transparency, speed and flexibility in scientific process design and data capture

Design your scientific processes in minutes.  When you need to adapt, the Riffyn SDE automatically updates its data storage, capture and analytics to ensure you continue your experiments with minimal disruption. Both the process and data are instantly shareable with collaborators.

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Shorter R&D cycles

The adaptable nature of the Riffyn SDE shortens R&D cycle times by integrating and analyzing data instantly across multiple experimental processes. Cycle time is further reduced by enabling process evolution without ongoing software development.

R&D objective Riffyn SDE Legacy
Design a scientific or production process 30 min to 1 wk Not available
Version control process and experiment designs Instant Not available
Create a database to capture process parameters and measurement data Instant 12 - 52 wks
Change database to match process changes Instant 1 - 12 wks
Design an experiment on a process 30 min Not available
Build data parsing system for any instrument 5 min 4 - 24 wks
Integrate data across R&D operations for root-cause investigation 5 min 2 - 12 wks
Integrate hundreds of experiments across time, scale 5 min 1 - 12 wks
Format data for analysis 5 min 1 day
Transfer a process between R&D functions or scales Instant 4 wks

Times are based on experiences of current Riffyn customers

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The Riffyn SDE delivers structured data ready for machine learning

Every process parameter and data point is reshaped into a standard statistical data frame that can be analyzed in any data processing pipeline, statistics engine or visualization software. This enables instant assessment of process and data quality and causal relationships. 

  • Error / variance analysis
  • Statistical process control
  • Multivariate regression


  • Hit picking
  • Material genealogy
  • Root cause analysis